The purpose of the DIC challenge is to supply the image correlation community with a set of images for software testing and verification. This is to include both commercial codes and university codes. The use of a common image data set rem…

JEOL streamlines the imaging and analytical workflow, allowing simple point and shoot navigation across the sample surface for imaging and analysis with any JEOL tungsten, LaB6, or field emission SEM and EPMA microscope.pro Fit is a Macint…

A giant has returned to life. Oberheim’s legendary SEM - Synthesizer Expander Module - is back for the first time as a high-end software emulation powered by Arturia’s exclusive TAE® technology. Spectrum’s comprehensive search software opt…

http://maruta.be/gaglory5zz/2In the Semiconductor Lithography and Etch applications, SIMAGIS is a powerful offline SEM Image Analysis solution for Top Down and Cross-Sections and from CD measurement to Line Edge and Line Width Roughness.We…